| Record ID | talis_openlibrary_contribution/talis-openlibrary-contribution.mrc:3121470957:683 |
| Source | Talis |
| Download Link | /show-records/talis_openlibrary_contribution/talis-openlibrary-contribution.mrc:3121470957:683?format=raw |
LEADER: 00683cam a22001452a 4500
001 9ec9c3f2ed12489b9c73be12d9045a49
003 UK-BiTAL
005 20050706044310.0
008 791015s1968 xxu | 000 ||eng|d
035 $a()x0294094
040 $aAU$cAU$dUK-BiTAL
111 2 $aReliability Physics Symposium$n(7th, Annual :$d1968 :$cWashington)
245 10 $aPresentation abstracts :$b7th annual Reliability Physics Symposium(formerly Physics of failure in electronics), Washington, 1968 /$cco-sponsored by the Electron Devices and Reliability groups of the Institute of Electrical and Electronics Engineers.
260 $bI.E.E.E.,$c1968.
710 2 $aInstitute of Electrical and Electronics Engineers.