| Record ID | talis_openlibrary_contribution/talis-openlibrary-contribution.mrc:3104191840:470 |
| Source | Talis |
| Download Link | /show-records/talis_openlibrary_contribution/talis-openlibrary-contribution.mrc:3104191840:470?format=raw |
LEADER: 00470nam a2200157 a 4500
001 2c792f3594dc43d384daf855422ae3da
003 UK-BiTAL
005 20050706043147.0
008 950210s1990 xxk | 000 ||eng|d
035 $a()w9724828
040 $aSU$cSU$dUK-BiTAL
100 1 $aZeroual, Boudjemaa.
245 00 $aIon bombardment induced damage and annealing in Si.
260 $aSalford :$bUniversity of Salford,$c1990.
490 0 $aD92740
502 $aPhD thesis, Electrical Engineering.