| Record ID | marc_university_of_toronto/uoft.marc:4569684950:1022 |
| Source | University of Toronto |
| Download Link | /show-records/marc_university_of_toronto/uoft.marc:4569684950:1022?format=raw |
LEADER: 01022cam 2200217Ia 4500
001 ocm52958812
005 20031216133929.0
008 030903s2003 waua b 101 0 eng d
020 $a0819449660
039 $fsom
245 00 $aOptical pattern recognition XIV :$b24-25 April, 2003, Orlando, Florida, USA /$cDavid P. Casasent, Tien-Hsin Chao, chairs/editors ; sponsored and published by SPIE--The International Society for Optical Engineering.
260 $aBellingham, Wash. :$bSPIE,$cc2003.
300 $avii, 332 p. :$bill. ;$c28 cm.
490 1 $aSPIE proceedings series ;$vv. 5106
504 $aIncludes bibliographical references and author index.
650 0 $aOptical pattern recognition$vCongresses.
700 1 $aCasasent, David Paul.
700 1 $aChao, Tien-Hsin.
710 2 $aSociety of Photo-optical Instrumentation Engineers.
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 5106.
949 $aTA1505 .O65 2003$wLC$c1$i31761062670393$lSTACKS$mENGI_CSCI$rY$sY$tBOOK$u17/12/2003