| Record ID | marc_uic/UIC_2022.mrc:2174716:1180 |
| Source | marc_uic |
| Download Link | /show-records/marc_uic/UIC_2022.mrc:2174716:1180?format=raw |
LEADER: 01180cam a2200373 a 4500
001 9931557112005897
005 20200411095114.0
008 820430s1982 nyua b 00110 eng
020 $a0122526805
035 $a6757149-01carli_network
035 $a(OCoLC)ocm08476304
035 $9ACQ-5930
035 $a(UIUdb)641758
035 $a(EXLNZ-01CARLI_NETWORK)991098971209705816
039 0 $a2$b3$c3$d3$e3
040 $aDLC$cDLC$dUIU$dUIUdb
050 0 $aQC176.8.C45$bF44 1982
082 0 $a620.1/1299$219
100 10 $aFeldman, Leonard C.
245 10 $aMaterials analysis by ion channeling :$bsubmicron crystallography /$cLeonard C. Feldman, James W. Mayer, S. Thomas Picraux.
260 0 $aNew York :$bAcademic Press,$c1982.
300 $axix, 300 p. :$bill. ;$c24 cm.
500 $aIncludes index.
504 $aBibliography: p. 235-295.
650 0 $aChanneling (Physics)
650 0 $aSolids$xSurfaces
650 0 $aIon bombardment
650 0 $aCrystallography
650 0 $aCrystals$xDefects
700 10 $aMayer, James W.,$d1930-
700 10 $aPicraux, S. T.,$d1943-
959 $a(UIUdb)641758
959 $a(UICdb)315571$9LOCAL
976 $a38198000442192