| Record ID | marc_records_scriblio_net/part25.dat:8185827:821 |
| Source | Scriblio |
| Download Link | /show-records/marc_records_scriblio_net/part25.dat:8185827:821?format=raw |
LEADER: 00821pam 2200229 a 4500
001 95021967
003 DLC
005 19970108122439.0
008 950612s1996 enkaf b 001 0 eng
010 $a 95021967
020 $a0198513879
040 $aDLC$cDLC$dDLC
050 00 $aQH212.A76$bA76 1996
082 00 $a502/.8/2$220
245 00 $aAtom probe field ion microscopy /$cM.K. Miller ... [et al.].
260 $aOxford :$bClarendon Press ;$aNew York :$bOxford University Press,$c1996.
300 $axi, 509 p., [4] p. of plates :$bill. (some col.) ;$c24 cm.
440 0 $aMonographs on the physics and chemistry of materials ;$v52
440 0 $aOxford science publications
504 $aIncludes bibliographical references and index.
650 0 $aAtom-probe field ion microscopy.
700 1 $aMiller, M. K.$q(Michael Kenneth)