| Record ID | marc_records_scriblio_net/part25.dat:34112314:1178 |
| Source | Scriblio |
| Download Link | /show-records/marc_records_scriblio_net/part25.dat:34112314:1178?format=raw |
LEADER: 01178cam 2200289 a 4500
001 95068531
003 DLC
005 19970116103820.8
008 960131s1995 waua b 101 0 eng d
010 $a 95068531
020 $a0819418765
035 $a(OCoLC)33891689
040 $aMoKL$cMoKL$dDLC
042 $alccopycat
050 04 $aQC482.S6$bX14 1995
245 00 $aX-ray and EUV/FUV spectroscopy and polarimetry :$b11-12 July, 1995, San Diego, California /$cSilvano Fineschi, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering.
260 $aBellingham, Wash., USA :$bSPIE,$cc1995.
300 $avii, 284 p. :$bill. ;$c28 cm.
490 1 $aSPIE proceedings series ;$vv. 2517
504 $aIncludes bibliographic references and author index.
650 0 $aX-ray spectroscopy$xCongresses.
650 0 $aUltraviolet spectroscopy$xCongresses.
650 0 $aAstronomical spectroscopy$xCongresses.
650 0 $aPolarimetry$xCongresses.
700 1 $aFineschi, Silvano.
710 2 $aSociety of Photo-optical Instrumentation Engineers.
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 2517.