| Record ID | marc_records_scriblio_net/part25.dat:170874737:883 |
| Source | Scriblio |
| Download Link | /show-records/marc_records_scriblio_net/part25.dat:170874737:883?format=raw |
LEADER: 00883cam 2200241 a 4500
001 96006824
003 DLC
005 20030804112113.0
008 960214s1997 njua b 001 0 eng
010 $a 96006824
020 $a0780311140
040 $aDLC$cDLC$dDLC
050 00 $aTK7895.M4$bS49 1997
082 00 $a621.39/732$220
100 1 $aSharma, Ashok K.
245 10 $aSemiconductor memories :$btechnology, testing, and reliability /$cAshok K. Sharma.
260 $aPiscataway, N.J. :$bIEEE Press ;$aNew York :$bInstitute of Electrical and Electronics Engineers,$cc1997.
300 $axii, 462 p. :$bill. ;$c26 cm.
500 $a"IEEE order number: PC3491"--P. [4] cover.
500 $a"IEEE Solid-State Circuits Council, sponsor."
504 $aIncludes bibliographical references and index.
650 0 $aSemiconductor storage devices.
710 2 $aIEEE Solid-State Circuits Council.