| Record ID | marc_records_scriblio_net/part21.dat:171365493:894 |
| Source | Scriblio |
| Download Link | /show-records/marc_records_scriblio_net/part21.dat:171365493:894?format=raw |
LEADER: 00894cam 2200229 a 4500
001 90227530
003 DLC
005 20020824204050.0
008 901214s1990 enka b 001 0 eng
010 $a 90227530
020 $a0521363799
040 $aDLC$cDLC$dDLC
050 00 $aQH212.A76$bT76 1990
082 00 $a502/.8/2$220
100 1 $aTsong, Tien Tsou,$d1934-
245 10 $aAtom-probe field ion microscopy :$bfield ion emission and surfaces and interfaces at atomic resolution /$cTien T. Tsong.
260 $aCambridge ;$aNew York :$bCambridge University Press,$c1990.
300 $ax, 387 p. :$bill. ;$c24 cm.
504 $aIncludes bibliographical references and index.
650 0 $aAtom-probe field ion microscopy.
856 42 $3Publisher description$uhttp://www.loc.gov/catdir/description/cam024/90227530.html
856 41 $3Table of contents$uhttp://www.loc.gov/catdir/toc/cam028/90227530.html