| Record ID | marc_records_scriblio_net/part20.dat:19637934:652 |
| Source | Scriblio |
| Download Link | /show-records/marc_records_scriblio_net/part20.dat:19637934:652?format=raw |
LEADER: 00652pam 2200241 a 4500
001 88030927
003 DLC
005 20010919143952.0
008 880923s1989 nyua 001 0 eng
010 $a 88030927
020 $a0827321279
020 $a0827321287 (Instructors guide)
040 $aDLC$cDLC$dDLC
050 00 $aT50$b.B8 1989
082 00 $a681/.2$219
100 1 $aBusch, Ted.
245 10 $aFundamentals of dimensional metrology /$cTed Busch.
250 $a2nd ed.
260 $aAlbany, N.Y. :$bDelmar,$cc1989.
300 $axi, 723 p. :$bill. ;$c23 cm.
500 $aIncludes index.
650 0 $aMensuration.
650 0 $aMeasuring instruments.