| Record ID | marc_records_scriblio_net/part20.dat:146958248:1218 |
| Source | Scriblio |
| Download Link | /show-records/marc_records_scriblio_net/part20.dat:146958248:1218?format=raw |
LEADER: 01218cam 2200289 a 4500
001 89024853
003 DLC
005 20040706102707.0
008 890915s1990 nyua b 001 0 eng
010 $a 89024853
020 $a0471522775
040 $aDLC$cDLC$dDLC
050 00 $aQA276$b.N45 1990
082 00 $a519.5$220
100 1 $aNelson, Wayne,$d1936-
245 10 $aAccelerated testing :$bstatistical models, test plans and data analyses /$cWayne Nelson.
260 $aNew York :$bWiley,$cc1990.
300 $axiv, 601 p. :$bill. ;$c25 cm.
440 0 $aWiley series in probability and mathematical statistics.$pApplied probability and statistics
500 $a"A Wiley-Interscience publication."
504 $aIncludes bibliographical references (p. 561-577).
650 0 $aFailure time data analysis.
650 0 $aReliability (Engineering)$xStatistical methods.
650 0 $aAccelerated life testing$xStatistical methods.
856 42 $3Contributor biographical information$uhttp://www.loc.gov/catdir/bios/wiley047/89024853.html
856 42 $3Publisher description$uhttp://www.loc.gov/catdir/description/wiley031/89024853.html
856 4 $3Table of Contents$uhttp://www.loc.gov/catdir/toc/onix01/89024853.html