Record ID | marc_records_scriblio_net/part16.dat:109952770:752 |
Source | Scriblio |
Download Link | /show-records/marc_records_scriblio_net/part16.dat:109952770:752?format=raw |
LEADER: 00752cam 2200217 a 4500
001 83014720 //r93
003 DLC
005 19930712144442.5
008 830721s1984 wb a b 00110 eng
010 $a 83014720 //r93
020 $a0387117946 (U.S.)
040 $aDLC$cDLC$dDLC
050 00 $aQH212.T7$bR43 1984
082 00 $a502/.8/2$219
100 10 $aReimer, Ludwig,$d1928-
245 10 $aTransmission electron microscopy :$bphysics of image formation and microanalysis /$cLudwig Reimer.
260 0 $aBerlin ;$aNew York :$bSpringer-Verlag,$c1984.
300 $axii, 521 p. :$bill. ;$c24 cm.
440 0 $aSpringer series in optical sciences ;$vv. 36
504 $aIncludes bibliographical references and index.
650 0 $aTransmission electron microscopy.