| Record ID | marc_records_scriblio_net/part16.dat:103404960:779 |
| Source | Scriblio |
| Download Link | /show-records/marc_records_scriblio_net/part16.dat:103404960:779?format=raw |
LEADER: 00779cam 2200229 a 4500
001 83006618 //r87
003 DLC
005 19900502134602.0
008 830502s1983 enka b 00100 eng
010 $a 83006618 //r87
020 $a047126279X :$c$108.00
040 $aDLC$cDLC$dDLC
050 00 $aTP156.S95$bP73 1983
082 00 $a620.1/1292$219
245 00 $aPractical surface analysis :$bby auger and x-ray photoelectron spectroscopy /$cedited by D. Briggs and M.P. Seah.
260 0 $aChichester ;$aNew York :$bWiley,$cc1983.
300 $axiv, 533 p. :$bill. ;$c24 cm.
504 $aIncludes bibliographical references and index.
650 0 $aSurfaces (Technology)$xAnalysis.
650 0 $aElectron spectroscopy.
700 10 $aBriggs, D.$q(David),$d1948-
700 10 $aSeah, M. P.