| Record ID | marc_oregon_summit_records/catalog_files/osu_bibs.mrc:764195252:1333 |
| Source | Oregon Libraries |
| Download Link | /show-records/marc_oregon_summit_records/catalog_files/osu_bibs.mrc:764195252:1333?format=raw |
LEADER: 01333nam a22003497a 4500
001 24664133
003 OR
008 940518r19911991dcu b f000 0 eng d
035 $a10844198
037 $aN 91-20500$bNASA
040 $aGPO$cGPO$dDLC$dMvI
049 $aOREF$lbna
074 $a830-D (MF)
086 $aNAS 1.15:104537
086 0 $aNAS 1.15:104537
099 $aNAS 1.15:104537
100 1 $aThomas, Walter B.
245 10 $aThermal shock testing for assuring reliability of glass-sealed microelectronic packages$h[microform] /$cWalter B. Thomas III, Michael D. Lewis.
260 $aGreenbelt, Md.:$bNational Aeronautics and Space Administration, Goddard Space Flight Center ;$a[Springfield, Va. :$bFor sale by the National Technical Information Service],$c1991.
300 $a1 v.
440 0 $aNASA technical memorandum ;$v104537.
533 $aMicrofiche.$b[Washington, D.C.? :$cNational Aeronautics and Space Administration],$d1991.$e1 microfiche.
500 $aDistributed to depository libraries in microfiche.
650 0 $aQuality assurance.
700 1 $aLewis, Michael D.,$d1937-
710 2 $aGoddard Space Flight Center.
907 $a.b17168430$bvdo $c-
902 $a040318
998 $b1$c981001$dm$ea$f-$g0
937 $aAssessment exclusion record.
999 $a19940518232847.0
945 $lvdonf$e1