| Record ID | marc_oregon_summit_records/catalog_files/osu_bibs.mrc:639361316:1104 |
| Source | Oregon Libraries |
| Download Link | /show-records/marc_oregon_summit_records/catalog_files/osu_bibs.mrc:639361316:1104?format=raw |
LEADER: 01104nam a2200337Ia 4500
001 32533644
003 OR
008 950601s1993 xx a 000 0 eng d
035 $a10668928
040 $aORE$cORE
049 $aOREV$lbna
090 $aLD4330 1993$b.G4
090 $aLD4330 1993$b.G4
100 1 $aGe, David Ying.
245 10 $aReliability and hot-electron effects in analog and mixed-mode circuits /$cby David Ying Ge.
260 $c1993.
300 $a66 leaves, bound :$bill. ;$c29 cm.
500 $aTypescript (photography)
502 $aThesis (M.S.)--Oregon State University, 1993.
504 $aIncludes bibliographical references (leaves 51-53)
650 0 $aHot carriers.
650 0 $aIntegrated circuits$xReliability.
650 0 $aMetal oxide semiconductor field-effect transistors.
650 0 $aDifferential amplifiers.
690 $aTheses, OSU$xElectrical and Computer Engineering.
907 $a.b16121600$bmulti$c-
902 $a050902
998 $b2$c981001$dm$ea$f-$g0
999 $a19950601151902.0
945 $lvge $d120006738914$e1
945 $ltsvn $d120006739458$e2