| Record ID | marc_oregon_summit_records/catalog_files/osu_bibs.mrc:1639444212:1515 |
| Source | Oregon Libraries |
| Download Link | /show-records/marc_oregon_summit_records/catalog_files/osu_bibs.mrc:1639444212:1515?format=raw |
LEADER: 01515nam a2200433Ka 4500
001 164819716
003 OCoLC
005 20070816095637.0
008 070816s1985 ohu b f000 0 eng d
035 $a(GPO)99215559
037 $aN 86-13495$bNASA
040 $aGPO$cGPO$dMvI
049 $aORE1
074 $a0830-D (MF)
086 0 $aNAS 1.15:87153
086 0 $aNAS 1.15:87153
100 1 $aSalem, J. A.$q(Jonathan A.),$d1960-
245 10 $aFracture toughness of Si₃N₄ measurement with short bar chevron-notched specimens$h[microform] /$cJonathan A. Salem and John L. Shannon, Jr.
260 $a[Cleveland, Ohio :$bNational Aeronautics and Space Administration, Lewis Research Center,$c1985]
300 $a1 v.
440 0 $aNASA technical memorandum ;$v87153.
533 $aMicrofiche.$b[Washington, D.C. :$cNational Aeronautics and Space Administration],$d1986.$e1 microfiche.
650 0 $aCeramics$xMechanical properties.
650 0 $aSilicon nitride.
650 7 $aCrack propagation.$2nasat.
650 7 $aFracture strength.$2nasat.
650 7 $aHot pressing.$2nasat.
650 7 $aLoads (forces)$2nasat.
650 7 $aNotch sensitivity.$2nasat.
650 7 $aNotch tests.$2nasat.
650 7 $aPlane strain.$2nasat.
650 7 $aSilicon nitrides.$2nasat.
700 1 $aShannon, John L.
710 2 $aLewis Research Center.
907 $a.b24575641$bvdo $cv
902 $a080208
998 $b1$c070921$dm$ea$fv$g0
937 $aAssessment exclusion record.
945 $lvdonf$e1