| Record ID | marc_loc_updates/v38.i40.records.utf8:4841651:1064 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_updates/v38.i40.records.utf8:4841651:1064?format=raw |
LEADER: 01064nam a22003134a 4500
001 2008930122
003 DLC
005 20100929102512.0
008 080530s2009 nyua b 001 0 eng d
010 $a 2008930122
020 $a9780387095783
020 $a0387095780
035 $a(OCoLC)ocn297525474
040 $aYDX$cYDX$dYDXCP$dBWX$dUUM$dOCLCQ$dDEBBG$dDLC
042 $alccopycat
050 00 $aQC482.D5$bP43 2009
100 1 $aPecharsky, Vitalij K.
245 10 $aFundamentals of powder diffraction and structural characterization of materials /$cVitalij K. Pecharsky and Peter Y. Zavalij.
250 $a2nd ed.
260 $aNew York :$bSpringer,$cc2009.
300 $axxiii, 741 p. :$bill. ;$c24 cm.
504 $aIncludes bibliographical references and index.
650 0 $aPowders$xOptical properties$xMeasurement.
650 0 $aX-rays$xDiffraction$xMeasurement.
650 0 $aX-ray crystallography.
650 07 $aKristallstrukturanalyse.$2swd
650 07 $aPulvermethode.$2swd
650 07 $aRöntgenstrukturanalyse.$2swd
700 1 $aZavalij, Peter Y.