| Record ID | marc_loc_updates/v36.i32.records.utf8:15976509:1127 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_updates/v36.i32.records.utf8:15976509:1127?format=raw |
LEADER: 01127nam a22002777a 4500
001 2008530931
003 DLC
005 20080809164525.0
008 080804s2007 waua b 101 0 eng d
010 $a 2008530931
020 $a9780819466969
020 $a0819466964
035 $a(OCoLC)ocn145732380
040 $aSCW$cSCW$dBTCTA$dDLC
042 $alccopycat
050 00 $aTA1650$b.O6794 2007
245 00 $aOptical pattern recognition XVIII :$b9-10 April 2007, Orlando, Florida, USA /$cDavid P. Casasent, Tien-Hsin Chao, editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
260 $aBellingham, Wash. :$bSPIE,$cc2007.
300 $a1 v. (various pagings) :$bill. ;$c28 cm.
490 1 $aProceedings of SPIE,$x0277-786X ;$vv. 6574
504 $aIncludes bibliographical references and author index.
650 0 $aOptical pattern recognition$vCongresses.
700 1 $aCasasent, David Paul.
700 1 $aChao, Tien-Hsin.
710 2 $aSociety of Photo-optical Instrumentation Engineers.
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 6574.