| Record ID | marc_loc_updates/v36.i01.records.utf8:1250431:651 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_updates/v36.i01.records.utf8:1250431:651?format=raw |
LEADER: 00651cam a22002291 4500
001 41001657
003 DLC
005 20080102181032.0
008 820128s1940 xx a 000 0 eng
010 $a 41001657
035 $a(OCoLC)14747727
040 $aDLC$cDNLM$dOAU$dDLC
042 $apremarc
050 00 $aBF39$b.W6
060 0 $aW1$bPS747 no.3 1940
100 1 $aWolfle, Dael Lee,$d1906-
245 10 $aFactor analysis to 1940.
260 $aChicago,$bUniv. of Chicago Press$c[1940]
300 $avii, 69 p.$bill.
440 0 $aPsychometric monographs,$vno. 3
650 0 $aCharacters and characteristics.
650 0 $aEducational tests and measurements