| Record ID | marc_loc_2016/BooksAll.2016.part42.utf8:110454436:1178 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part42.utf8:110454436:1178?format=raw |
LEADER: 01178cam a2200313 i 4500
001 2015304326
003 DLC
005 20150722083618.0
008 150512t20132013njua b 100 0 eng
010 $a 2015304326
020 $a9781467349512 (paperback)
040 $aDLC$beng$erda$cDLC$dDLC
042 $apcc
050 00 $aTK7874$b.I47378 2013
082 00 $a621.3815$223
111 2 $aInternational Symposium on Quality Electronic Design$n(14th :$d2013 :$cSanta Clara, Calif.)
245 10 $aInternational Symposium on Quality Electronic Design (ISQED 2013) :$bSanta Clara, California, USA, 4-6 March 2013.
246 30 $aISQED 2013
264 1 $aPiscataway, NJ :$bIEEE,$c[2013]
264 4 $c©2013
300 $a738 pages :$billustrations ;$c27 cm
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
338 $avolume$bnc$2rdacarrier
500 $a"IEEE Catalog Number: CFP13250-PRT."
504 $aIncludes bibliographical references.
650 0 $aIntegrated circuits$xReliability$vCongresses.
650 0 $aIntegrated circuits$xDesign and construction$xQuality control$vCongresses.
710 2 $aInstitute of Electrical and Electronics Engineers.