| Record ID | marc_loc_2016/BooksAll.2016.part40.utf8:17634050:1293 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part40.utf8:17634050:1293?format=raw |
LEADER: 01293cam a22003377a 4500
001 2012392439
003 DLC
005 20120525083833.0
008 120417s2011 waua b 100 0 eng d
010 $a 2012392439
016 7 $a015862389$2Uk
020 $a0819486671
020 $a9780819486677
035 $a(OCoLC)ocn751793520
040 $aUKMGB$beng$cUKMGB$dCAI$dDLC
042 $alccopycat
050 00 $aQC374$b.D363 2011
082 00 $a543/.62$223
245 00 $aDamage to VUV, EUV, and x-ray optics III :$b18-19 April 2011, Prague, Czech Republic /$cLibor Juha, Saša Bajt, Richard A. London, editors ; sponsored and published by SPIE ; cooperating organizations, ELI Beamlines, HiPER.
260 $aBellingham, Wash. :$bSPIE,$c2011.
300 $a1 v. (various pagings) :$bill. ;$c28 cm.
490 1 $aProceedings of SPIE,$x0277-786X ;$vv. 8077
504 $aIncludes bibliographical references and author index.
650 0 $aOptical materials$xDeterioration$vCongresses.
650 0 $aFar ultraviolet radiation$vCongresses.
650 0 $aX-ray optics$vCongresses.
700 1 $aJuha, Libor.
700 1 $aBajt, Saša.
700 1 $aLondon, Richard A.
710 2 $aSPIE (Society)
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 8077.