| Record ID | marc_loc_2016/BooksAll.2016.part37.utf8:95294579:1518 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part37.utf8:95294579:1518?format=raw |
LEADER: 01518cam a2200373 a 4500
001 2009920955
003 DLC
005 20110420082910.0
008 090115s2009 nyua b 001 0 eng c
010 $a 2009920955
020 $a9780387881355 (alk. paper)
020 $z9780387881362 (e-ISBN)
035 $a(OCoLC)ocn308158147
040 $aYDXCP$cYDXCP$dBTCTA$dBWX$dWTU$dGBVCP$dDEBBG$dOCL$dSOI$dIQU$dDLC
042 $apcc
050 00 $aTA417.23$b.E419 2009
084 $aUQ 5500$2rvk
084 $aZM 3850$2rvk
084 $aWER 780f$2stub
245 00 $aElectron backscatter diffraction in materials science /$cAdam J. Schwartz ... [et al.], eds.
250 $a2nd ed.
260 $aNew York :$bSpringer,$cc2009.
300 $axxii, 403 p. :$bill. (some col.) ;$c27 cm.
504 $aIncludes bibliographical references and index.
650 0 $aMaterials$xMicroscopy.
650 0 $aScanning electron microscopy.
650 0 $aCrystallography.
650 07 $aElektronenbeugung.$2swd
650 07 $aKristallographie.$2swd
650 07 $aRückstreuung.$2swd
700 1 $aSchwartz, Adam J.
856 41 $3Table of contents$uhttp://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&doc_number=018639269&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA
856 41 $mDE-576;springer$qapplication/pdf$uhttp://swbplus.bsz-bw.de/bsz302803726inh.htm$v20090623093600$3Inhaltsverzeichnis
856 4 $mDE-576;springer$qapplication/pdf$uhttp://swbplus.bsz-bw.de/bsz302803726kap.htm$v20090623101948$3Kapitel 2