MARC Record from Library of Congress

LEADER: 02737cam a2200313 a 4500
001 2010011811
003 DLC
005 20121122081135.0
008 100405s2011 flua b 001 0 eng
010 $a 2010011811
015 $aGBB012255$2bnb
016 7 $a015479214$2Uk
020 $a9781439826942 (hc : alk. paper)
020 $a1439826943 (hc : alk. paper)
035 $a(OCoLC)ocn435419190
040 $aDLC$cDLC$dYDX$dUKM$dBTCTA$dYDXCP$dCDX$dBWX$dFER$dUNA$dDLC
042 $apcc
050 00 $aTK7871.85$b.R317 2011
082 00 $a621.3815/2$222
245 00 $aRadiation effects in semiconductors /$cedited by Krzysztof Iniewski.
260 $aBoca Raton :$bCRC Press,$cc2011.
300 $axv, 415 p. :$bill. ;$c25 cm.
490 1 $aDevices, circuits, and systems
504 $aIncludes bibliographical references and index.
505 0 $aRadiation damage in silicon / Gianluigi Casse -- Radiation-tolerant CMOS single-photon imagers for multiradiation detection / Edoardo Charbon ... [et al.] -- Effects of hydrogen on the radiation response on field-oxide field-effect transistors and high-k dielectrics / Xing J. Zhou, Daniel M. Fleetwood, and Ronald D. Schrimpf -- Novel total dose and heavy-ion charge collection phenomena in a new SiGe HBT on thin-film SOI technology / Grégory Avenier ... [et al.] -- Radiation-hard voltage and current references in standard CMOS technologies / Vladimir Gromov and Anne-Johan Annema -- Nanocrystal memories : an evolutionary approach to flash memory scaling and a class of radiation-tolerant devices / Cosimo Gerardi ... [et al.] -- Radiation hardened by design SRAM strategies for TID and SEE mitigation / Lawrence T. Clark -- A complete guide to multiple upsets in SRAMs processed in decananometric CMOS technologies / Gilles Gasiot and Phillippe Roche -- Real-time soft error rate characterization of advanced SRAMs / Jean-Luc Autran ... [et al.] -- Fault tolerance techniques and reliability modeling for SRAM-based FPGAs / Keith S. Morgan ... [et al.] -- Assuring robust triple modular redundancy protected circuits in SRAM-based FPGAs / Michael Caffrey ... [et al.] -- SEU/SET tolerant phase-locked loops / Robert L. Shuler, Jr. -- Autonomous detection and characterization of radiation-induced transients in semiconductor integrated circuits / Balaji Narasimham ... [et al.] -- Soft errors in digital circuits : overview and protection techniques for digital filters / Pedro reviriego Vasallo and Juan Antonio Maestro -- Fault-injection techniques for dependability analysis : an overview / Massimo Violante.
650 0 $aSemiconductors$xEffect of radiation on.
650 0 $aPhoton emission.
700 1 $aIniewski, Krzysztof,$d1960-
830 0 $aDevices, circuits, and systems.