| Record ID | marc_loc_2016/BooksAll.2016.part31.utf8:226609318:1207 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part31.utf8:226609318:1207?format=raw |
LEADER: 01207cam a2200301 a 4500
001 2004304165
003 DLC
005 20050308094037.0
008 041108s2004 waua b 101 0 eng d
010 $a 2004304165
020 $a0819453609
035 $a(OCoLC)ocm55653238
040 $aCUS$cCUS$dIXA$dDLC
042 $alccopycat
050 00 $aTA1650$b.O6793 2004
082 00 $a006.4/2$222
245 00 $aOptical pattern recognition XV :$b15-16 April 2004, Orlando, Florida, USA /$cDavid P. Casasent, Tien-Hsin Chao, chairs/editors ; sponsored ... by SPIE--The International Society for Optical Engineering.
246 3 $aOptical pattern recognition 15
246 3 $aOptical pattern recognition fifteen
260 $aBellingham, Wash., USA :$bSPIE,$cc2004.
300 $aviii, 320 p. :$bill. ;$c28 cm.
490 1 $aSPIE proceedings series,$x0277-786X ;$vv. 5437
504 $aIncludes bibliographical references and index.
650 0 $aOptical pattern recognition$vCongresses.
700 1 $aCasasent, David Paul.
700 1 $aChao, Tien-Hsin.
710 2 $aSociety of Photo-optical Instrumentation Engineers.
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 5437.