| Record ID | marc_loc_2016/BooksAll.2016.part29.utf8:193606657:1043 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part29.utf8:193606657:1043?format=raw |
LEADER: 01043cam a22002654a 4500
001 2002030864
003 DLC
005 20070301081733.0
008 020909s2003 paua b 001 0 eng
010 $a 2002030864
020 $a0898715229
040 $aDLC$cDLC$dDLC
042 $apcc
050 00 $aQA276$b.R465 2003
082 00 $a519.5$221
100 1 $aNelson, Wayne,$d1936-
245 10 $aRecurrent events data analysis for product repairs, disease recurrences, and other applications /$cWayne B. Nelson.
260 $aPhiladelphia :$bSociety for Industrial and Applied Mathematics,$cc2003.
300 $axi, 151 p. :$bill. ;$c27 cm.
440 0 $aASA-SIAM series on statistics and applied probability
504 $aIncludes bibliographical references (p. 137-142) and index.
650 0 $aFailure time data analysis.
650 0 $aSurvival analysis (Biometry)
856 41 $3Table of contents$uhttp://www.loc.gov/catdir/toc/fy037/2002030864.html
856 42 $3Publisher description$uhttp://www.loc.gov/catdir/enhancements/fy0708/2002030864-d.html