| Record ID | marc_loc_2016/BooksAll.2016.part28.utf8:201458294:1141 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part28.utf8:201458294:1141?format=raw |
LEADER: 01141cam a22003014a 4500
001 2001023211
003 DLC
005 20080311085803.0
008 010202s2001 maua b 001 0 eng
010 $a 2001023211
020 $a0792373146 (hardcover : alk. paper)
040 $aDLC$cDLC$dDLC
042 $apcc
050 00 $aTK7870.23$b.S64 2001
082 00 $a621.381$221
100 1 $aSousa, José T. de.
245 10 $aBoundary-scan interconnect diagnosis /$cJosé T. de Sousa, Peter Y.K. Cheung.
260 $aBoston :$bKluwer Academic Publishers,$cc2001.
300 $axxi, 168 p. :$bill. ;$c25 cm.
440 0 $aFrontiers in electronic testing ;$v18
504 $aIncludes bibliographical references (p. 145-150) and index.
650 0 $aBoundary scan testing.
650 0 $aElectronic apparatus and appliances$xTesting.
650 0 $aElectronic packaging.
650 0 $aElectric contacts$xTesting.
700 1 $aCheung, Peter Y. K.
856 42 $3Publisher description$uhttp://www.loc.gov/catdir/enhancements/fy0821/2001023211-d.html
856 41 $3Table of contents only$uhttp://www.loc.gov/catdir/enhancements/fy0821/2001023211-t.html