| Record ID | marc_loc_2016/BooksAll.2016.part21.utf8:8850897:838 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part21.utf8:8850897:838?format=raw |
LEADER: 00838cam a2200253 a 4500
001 91019636
003 DLC
005 19920210091502.1
008 910507s1991 nyua b 001 0 eng
010 $a 91019636
020 $a0306437929
040 $aDLC$cDLC$dDLC
050 00 $aQC176.8.S8$bI66 1991
082 00 $a541.3/3$220
245 00 $aIon spectroscopies for surface analysis /$cedited by A.W. Czanderna and David M. Hercules.
260 0 $aNew York :$bPlenum Press,$cc1991.
300 $axvii, 469 p. :$bill. ;$c24 cm.
440 0 $aMethods of surface characterization ;$vv. 2
504 $aIncludes bibliographical references and index.
650 0 $aSolids$xSurfaces$xAnalysis.
650 0 $aSecondary ion mass spectrometry.
650 0 $aSurface chemistry.
700 10 $aCzanderna, Alvin Warren,$d1930-
700 10 $aHercules, David M.