| Record ID | marc_loc_2016/BooksAll.2016.part21.utf8:2430839:772 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part21.utf8:2430839:772?format=raw |
LEADER: 00772cam a2200229 a 4500
001 91011690
003 DLC
005 20141113073951.0
008 910227s1992 nyua 001 0 eng
010 $a 91011690
020 $a067521162X
040 $aDLC$cDLC$dDLC
050 00 $aTK7878.4$b.B79 1992
082 00 $a621.381/54$220
100 1 $aBuchla, David M.
245 10 $aApplied electronic instrumentation and measurement /$cDavid Buchla, Wayne McLachlan.
260 $aNew York :$bMerrill ;$aToronto :$bCollier Macmillan Canada ;$aNew York :$bMaxwell Macmillan International Pub. Group,$cc1992.
300 $axviii, 830 p :$bill. ;$c24 cm.
500 $aIncludes index.
650 0 $aElectronic instruments.
650 0 $aElectronic measurements.
700 1 $aMcLachlan, Wayne.