| Record ID | marc_loc_2016/BooksAll.2016.part21.utf8:212706051:1259 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part21.utf8:212706051:1259?format=raw |
LEADER: 01259cam a2200301 a 4500
001 92039926
003 DLC
005 20080311083508.0
008 921026s1993 maua b 001 0 eng
010 $a 92039926
020 $a0792393155
040 $aDLC$cDLC$dDLC
050 00 $aTK7874$b.I3223 1993
082 00 $a621.39/5$220
245 00 $aIDDQ testing of VLSI circuits /$cedited by Ravi K. Gulati and Charles F. Hawkins.
260 $aBoston :$bKluwer Academic Publishers,$cc1993.
300 $a120 p. :$bill. ;$c27 cm.
440 0 $aFrontiers in electronic testing
500 $a"A Special issue of Journal of electronic testing: theory and applications."
500 $a"Reprinted from Journal of electronic testing: theory and applications, vol. 3, no. 4."
500 $aDDQ is subscript in IDDQ in title; testing method also known as quiescent current testing.
504 $aIncludes bibliographical references and index.
650 0 $aIntegrated circuits$xVery large scale integration$xTesting.
650 0 $aMetal oxide semiconductors, Complementary$xTesting.
650 0 $aIddq testing.
700 1 $aGulati, Ravi K.
700 1 $aHawkins, Charles F.
856 42 $3Publisher description$uhttp://www.loc.gov/catdir/enhancements/fy0820/92039926-d.html