| Record ID | marc_loc_2016/BooksAll.2016.part21.utf8:188367562:793 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part21.utf8:188367562:793?format=raw |
LEADER: 00793pam a2200229 a 4500
001 92009840
003 DLC
005 19920709150542.9
008 920303s1992 nyua b 001 0 eng
010 $a 92009840
020 $a0306441756
040 $aDLC$cDLC$dDLC
050 00 $aQH212.S3$bS29 1992
082 00 $a502/.8/25$220
245 00 $aScanning electron microscopy and X-ray microanalysis :$ba text for biologists, materials scientists, and geologists /$cJoseph I. Goldstein ... [et al.].
250 $a2nd ed.
260 $aNew York :$bPlenum Press,$cc1992.
300 $axviii, 820 p. :$bill. ;$c26 cm.
504 $aIncludes bibliographical references (p. 787-805) and index.
650 0 $aScanning electron microscopy.
650 0 $aX-ray microanalysis.
700 10 $aGoldstein, Joseph,$d1939-