| Record ID | marc_loc_2016/BooksAll.2016.part20.utf8:67705295:1227 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part20.utf8:67705295:1227?format=raw |
LEADER: 01227nam a2200265 a 4500
001 90053280
003 DLC
005 19910909084651.2
008 900606s1990 waua b 10100 eng
010 $a 90053280
020 $a0819403725
040 $aDLC$cDLC
050 00 $aQC440$b.P64 1990
082 00 $a621.36$220
245 00 $aPolarimetry--radar, infrared, visible, ultraviolet, and x-ray :$b15-17 May 1990, Huntsville, Alabama /$cRussell A. Chipman, John W. Morris, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, in association with the Huntsville Association of Technical Societies.
260 0 $aBellingham, Wash., USA :$bSPIE,$cc1990.
300 $avii, 449 p. :$bill. ;$c28 cm.
490 1 $aProceedings / SPIE--the International Society for Optical Engineering ;$vv. 1317
504 $aIncludes bibliographical references and index.
650 0 $aPolarimetry$xCongresses.
700 10 $aChipman, Russell A.
700 10 $aMorris, John W.$q(John Wylie),$d1942-
710 20 $aSociety of Photo-optical Instrumentation Engineers.
710 20 $aHuntsville Association of Technical Societies.
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 1317.