| Record ID | marc_loc_2016/BooksAll.2016.part18.utf8:10684296:1082 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part18.utf8:10684296:1082?format=raw |
LEADER: 01082cam a2200277 a 4500
001 87024605
003 DLC
005 20060718185050.0
008 870908m19881993ne a b 001 0 eng
010 $a 87024605
020 $a0444989390 (v. 1) :$c$175.00 (est.)
020 $a0444989188 (v. 2)
020 $a044498819X (v. 3)
040 $aDLC$cDLC$dDLC
041 1 $aeng$hpol
050 00 $aQH207$b.P54 1988
082 00 $a502/.8/2$219
100 1 $aPluta, Maksymilian.
245 10 $aAdvanced light microscopy /$cMaksymilian Pluta.
260 $aWarszawa :$bPWN ;$aAmsterdam ;$aNew York :$bElsevier :$bDistribution for the USA and Canada, Elsevier Science Publishing Co.,$c1988-1993.
300 $a3 v. :$bill. ;$c25 cm.
500 $aTranslated from the Polish manuscript.
504 $aIncludes bibliographical references and indexes.
505 0 $av. 1. Principles and basic properties -- v. 2. Specialized methods -- v. 3. Measuring techniques.
650 0 $aMicroscopy$xTechnique.
856 42 $3Publisher description$uhttp://www.loc.gov/catdir/enhancements/fy0601/87024605-d.html