| Record ID | marc_loc_2016/BooksAll.2016.part09.utf8:44935799:759 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part09.utf8:44935799:759?format=raw |
LEADER: 00759cam a2200241 i 4500
001 75045196
003 DLC
005 19900503123155.4
008 751229s1976 nyu b 00110 eng
010 $a 75045196 //r90
020 $a0080196926 :$c$15.00
040 $aDLC$cDLC$dDLC
050 00 $aQD945$b.T36 1976
082 00 $a548/.83
100 10 $aTanner, B. K.$q(Brian Keith)
245 10 $aX-ray diffraction topography /$cby B. K. Tanner.
250 $a1st ed.
260 0 $aNew York :$bPergamon Press,$c1976.
300 $axiii, 174 p. ;$c26 cm.
490 0 $aInternational series in the science of the solid state ; v. 10
490 0 $aPergamon international library
504 $aIncludes bibliographical references and index.
650 0 $aX-ray crystallography.