| Record ID | marc_loc_2016/BooksAll.2016.part01.utf8:29710364:1152 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part01.utf8:29710364:1152?format=raw |
LEADER: 01152cam a22002894a 4500
001 00046212
003 DLC
005 20080311080853.0
008 000829s2000 maua b 001 0 eng
010 $a 00046212
020 $a0792379918 (alk. paper)
040 $aDLC$cDLC$dDLC
042 $apcc
050 00 $aTK7874.75$b.B87 2000
082 00 $a621.39/5$221
100 1 $aBushnell, Michael L.$q(Michael Lee),$d1950-
245 10 $aEssentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /$cMichael L. Bushnell, Vishwani D. Agrawal.
260 $aBoston :$bKluwer Academic,$cc2000.
300 $axviii, 690 p. :$bill. ;$c26 cm.
440 0 $aFrontiers in electronic testing ;$v17
504 $aIncludes bibliographical references (p. [631]-670) and index.
650 0 $aIntegrated circuits$xVery large scale integration$xTesting.
650 0 $aDigital integrated circuits$xTesting.
650 0 $aMixed signal circuits$xTesting.
650 0 $aSemiconductor storage devices$xTesting.
700 1 $aAgrawal, Vishwani D.,$d1943-
856 41 $3Table of contents only$uhttp://www.loc.gov/catdir/enhancements/fy0821/00046212-t.html