| Record ID | marc_loc_2016/BooksAll.2016.part01.utf8:216357981:1335 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part01.utf8:216357981:1335?format=raw |
LEADER: 01335cam a2200325 a 4500
001 00710614
003 DLC
005 20010423133258.0
008 001102s1999 waua b 101 0 eng d
010 $a 00710614
020 $a0819432504
035 $a(OCoLC)ocm43288815
040 $aCUS$cCUS$dDLC
042 $alccopycat
050 00 $aQB468$b.U48 1999
082 00 $a522/.6863$221
245 00 $aUltraviolet and X-ray detection, spectroscopy, and polarimetry III :$b19-20 July 1999, Denver, Colorado /$cSilvano Fineschi, Bruce E. Woodgate, Randy A. Kimble, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
260 $aBellingham, Wash. :$bSPIE,$cc1999.
300 $avii, 288 p. :$bill. ;$c28 cm.
490 1 $aSPIE proceedings series,$x0277-786X ;$vv. 3764
504 $aIncludes bibliographical references and index.
650 0 $aPolarimetry$vCongresses.
650 0 $aX-ray astronomy$xInstruments$vCongresses.
650 0 $aUltraviolet astronomy$xInstruments$vCongresses.
650 0 $aUltraviolet detectors$vCongresses.
700 1 $aFineschi, Silvano.
700 1 $aWoodgate, Bruce.
700 1 $aKimble, Randy Alan.
710 2 $aSociety of Photo-optical Instrumentation Engineers.
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 3764.