| Record ID | marc_loc_2016/BooksAll.2016.part01.utf8:216345073:1454 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part01.utf8:216345073:1454?format=raw |
LEADER: 01454cam a2200325 a 4500
001 00710602
003 DLC
005 20070113080406.0
008 001106s2000 enka b 101 0 eng d
010 $a 00710602
015 $aGBA0-54908
020 $a0750306858
035 $a(OCoLC)ocm44915986
040 $aUKM$cUKM$dDLC
042 $alccopycat
050 00 $aQD117.E42$bI58 2000
082 00 $a545/.842$221
110 2 $aInternational Union of Microbeam Analysis Societies.$bConference$n(2nd :$d2000 :$cKailua Kona, Hawaii)
245 10 $aMicrobeam analysis 2000 :$bproceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000 /$cedited by David B Williams and Ryuichi Shimizu ; edited by David B Williams and Ryuichi Shimizu.
260 $aBristol ;$aPhiladelphia :$bInstitute of Physics Publishing,$cc2000.
300 $axxviii, 498 p. :$bill. ;$c24 cm.
440 0 $aInstitute of Physics conference series ;$vno. 165
504 $aIncludes bibliographical references and index.
650 0 $aElectron probe microanalysis$vCongresses.
650 0 $aMicroprobe analysis$vCongresses.
650 0 $aMicrurgy$vCongresses.
650 0 $aSpectrum analysis$vCongresses.
700 1 $aWilliams, David B.$q(David Bernard),$d1949-
700 1 $aShimizu, R.$q(Ryūichi),$d1937-
856 42 $3Publisher description$uhttp://www.loc.gov/catdir/enhancements/fy0705/00710602-d.html