| Record ID | marc_columbia/Columbia-extract-20221130-031.mrc:46137238:4567 |
| Source | marc_columbia |
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LEADER: 04567cam a2200637 a 4500
001 15071596
005 20220627125239.0
006 m o d
007 cr cnu||||||||
008 080423s2008 flua ob 000 0 eng d
035 $a(OCoLC)ocn226132777
035 $a(NNC)15071596
040 $aHNK$beng$epn$cHNK$dTXJ$dPUL$dCUS$dN$T$dVLB$dE7B$dOCLCQ$dMYPMP$dOCLCQ$dTULIB$dOCLCQ$dOCLCF$dOTZ$dCRCPR$dIDEBK$dUA@$dYDXCP$dCAUOI$dOCLCQ$dPIFBY$dOCLCQ$dUAB$dOCLCQ$dCEF$dUPM$dNLE$dYDX$dAU@$dUKMGB$dWYU$dS9I$dTYFRS$dESU$dUKAHL$dK6U$dOCLCO$dOCLCQ$dOCLCO
015 $aGBB7B1073$2bnb
016 7 $a018393991$2Uk
019 $a186942042$a648333288$a759861265$a779917047$a992053465$a994899729$a1031041982$a1058513467
020 $a1420066900
020 $a9781420066906
020 $a9781420066913$q(electronic bk.)
020 $a1420066919$q(electronic bk.)
020 $a9781315218885
020 $a1315218887
020 $a9781351826082
020 $a1351826085
024 7 $a10.1201/9781315218885$2doi
035 $a(OCoLC)226132777$z(OCoLC)186942042$z(OCoLC)648333288$z(OCoLC)759861265$z(OCoLC)779917047$z(OCoLC)992053465$z(OCoLC)994899729$z(OCoLC)1031041982$z(OCoLC)1058513467
037 $aTANDF_189159$bIngram Content Group
050 4 $aTK7871.96.B55$bS54 2008
072 7 $aTEC$x008110$2bisacsh
082 04 $a621.3815/28$222
049 $aZCUA
245 00 $aSilicon heterostructure devices /$cedited by John D. Cressler.
260 $aBoca Raton :$bCRC Press,$c©2008.
300 $a1 online resource (1 volume (various pagings)) :$billustrations
336 $atext$btxt$2rdacontent
337 $acomputer$bc$2rdamedia
338 $aonline resource$bcr$2rdacarrier
347 $adata file
504 $aIncludes bibliographical references.
505 0 $aChapter 1 The Big Picture -- chapter 2 A Brief History of the Field -- part 3 Overview: SiGe HBTs -- chapter 4 Device Physics -- chapter 5 Second-Order Effects -- chapter 6 Low-Frequency Noise -- chapter 7 Broadband Noise -- chapter 8 Microscopic Noise Simulation -- chapter 9 Linearity -- chapter 10 pnp SiGe HBTs -- chapter 11 Temperature Effects -- chapter 12 Radiation Effects -- chapter 13 Reliability Issues -- chapter 14 Self-Heating and Thermal Effects -- chapter 15 Device-Level Simulation -- chapter 16 SiGe HBT Performance Limits -- part 17 Overview: Heterostructure FETs -- chapter 18 Biaxial Strained Si CMOS -- chapter 19 Uniaxial Stressed Si MOSFET -- chapter 20 SiGe-Channel HFETs -- chapter 21 Industry Examples at the State-of-the-Art: Intel's 90nm Logic Technologies -- part 22 Overview: Other Heterstructure Devices -- chapter 23 Resonant Tunneling Devices -- chapter 24 IMPATT Diodes -- chapter 25 Engineered Substrates for Electronic and Optoelectronic Systems -- chapter 26 Self-Assembling Nanostructures in Ge(Si)-Si Heteropitaxy -- part 27 Overview: Optoelectronic Components -- chapter 28 Si-Si Ge LEDs -- chapter 29 Near-Infrared Detectors -- chapter 30 Si-Based Photonic Transistor Devices for Integrated Optoelectronics -- chapter 31 Si-SiGe Quantum Cascade Emitters.
520 $aSiGe HBTs are the most mature of the Si heterostructure devices and not surprisingly the most completely researched and discussed in the technical literature. However, new effects and nuances of device operation are uncovered year-after-year as transistor scaling advances and application targets march steadily upward in frequency and sophistication. Providing a comprehensive treatment of SiGe HBTs, Silicon Heterostructure Devices covers an amazingly diverse set of topics, ranging from basic transistor physics to noise, radiation effects, reliability, and TCAD simulation. Drawn from t.
546 $aEnglish.
650 0 $aBipolar transistors.
650 0 $aHeterostructures.
650 0 $aBipolar integrated circuits$xDesign and construction.
650 6 $aTransistors bipolaires.
650 6 $aHétérostructures.
650 7 $aTECHNOLOGY & ENGINEERING$xElectronics$xTransistors.$2bisacsh
650 7 $aBipolar integrated circuits$xDesign and construction.$2fast$0(OCoLC)fst00832872
650 7 $aBipolar transistors.$2fast$0(OCoLC)fst00832874
650 7 $aHeterostructures.$2fast$0(OCoLC)fst00955801
655 4 $aElectronic books.
700 1 $aCressler, John D.
776 08 $iPrint version:$tSilicon heterostructure devices.$dBoca Raton : CRC Press, ©2008$z9781420066906$w(DLC) 2007030748$w(OCoLC)159822425
856 40 $uhttp://www.columbia.edu/cgi-bin/cul/resolve?clio15071596$zTaylor & Francis eBooks
852 8 $blweb$hEBOOKS