| Record ID | marc_columbia/Columbia-extract-20221130-031.mrc:170350090:3609 |
| Source | marc_columbia |
| Download Link | /show-records/marc_columbia/Columbia-extract-20221130-031.mrc:170350090:3609?format=raw |
LEADER: 03609cam a2200637Ii 4500
001 15105543
005 20220423233201.0
006 m o d
007 cr |||||||||||
008 150509t20082008flua ob 000 0 eng d
035 $a(OCoLC)ocn908077567
035 $a(NNC)15105543
040 $aEBLCP$beng$erda$epn$cEBLCP$dDEBSZ$dOCLCQ$dN$T$dOCLCF$dOCLCQ$dUKMGB$dOTZ$dTYFRS$dAU@$dUKAHL$dOCLCQ$dMUU$dSTF$dSFB$dK6U$dOCLCO
015 $aGBB7B0996$2bnb
016 7 $a018393906$2Uk
019 $a1162334313$a1202483614
020 $a9781420042955$qelectronic book
020 $a1420042955$qelectronic book
020 $a9781420042948$qhardcover ;$qalk. paper
020 $a1420042947$qhardcover ;$qalk. paper
020 $a9780429143908$q(e-book : PDF)
020 $a0429143907
024 7 $a10.1201/9781420042955$2doi
035 $a(OCoLC)908077567$z(OCoLC)1162334313$z(OCoLC)1202483614
037 $aTANDF_188665$bIngram Content Group
050 4 $aTA410
072 7 $aTEC$x009000$2bisacsh
072 7 $aTEC$x035000$2bisacsh
072 7 $aTGM$2bicscc
082 04 $a620.110287
049 $aZCUA
100 1 $aZhang, Sam,$eauthor.
245 10 $aMaterials characterization techniques /$cSam Zhang, Lin Li, Ashok Kumar.
264 1 $aBoca Raton, FL :$bCRC Press/Taylor & Francis Group,$c[2008]
264 4 $c©2008
300 $a1 online resource (328 pages) :$billustrations
336 $atext$btxt$2rdacontent
337 $acomputer$bc$2rdamedia
338 $aonline resource$bcr$2rdacarrier
504 $aIncludes bibliographical references and index.
505 0 $aContact angle in surface analysis -- X-ray photoelectron spectroscopy and Auger electron spectroscopy -- Scanning tunneling microscopy and atomic force microscopy -- X-ray diffraction -- Transmission electron microscopy -- Scanning electron microscopy -- Chromatographic methods -- Infrared spectroscopy and UV/Vis spectroscopy -- Macro and micro thermal analyses -- Laser confocal fluorescence microscopy.
520 $a"With an emphasis on practical applications and real-world case studies, Materials Characterization Techniques presents the principles of widely used advanced surface and structural characterization techniques for quality assurance, contamination control, and process improvement. The book reviews the most popular and powerful analysis and quality control tools, explaining the appropriate uses and related technical requirements. The text features coverage of a wide range of topics, including Auger electron spectroscopy, atomic force microscopy, transmission electron microscopy, gel electrophoresis chromatography, laser confocal scanning florescent microscopy, and UV spectroscopy"--Publisher's description.
588 $aDescription based on online resource; title from resource home page (Taylor & Francis, viewed August 28, 2020).
546 $aEnglish.
650 0 $aMaterials$xTesting.
650 6 $aMatériaux$xEssais.
650 7 $aTECHNOLOGY & ENGINEERING$xEngineering (General)$2bisacsh
650 7 $aTECHNOLOGY & ENGINEERING$xReference.$2bisacsh
650 7 $aMaterials$xTesting.$2fast$0(OCoLC)fst01011882
655 0 $aElectronic books.
655 4 $aElectronic books.
700 1 $aLi, L.$q(Lin),$d1959-$eauthor.
700 1 $aKumar, Ashok,$d1962-$eauthor.
776 08 $iPrint version:$aZhang, Sam.$tMaterials characterization techniques.$dBoca Raton : CRC Press, ©2009$z9781420042948$w(DLC) 2008030739$w(OCoLC)144523105
856 40 $uhttp://www.columbia.edu/cgi-bin/cul/resolve?clio15105543$zTaylor & Francis eBooks
852 8 $blweb$hEBOOKS