| Record ID | marc_columbia/Columbia-extract-20221130-016.mrc:56363273:1432 |
| Source | marc_columbia |
| Download Link | /show-records/marc_columbia/Columbia-extract-20221130-016.mrc:56363273:1432?format=raw |
LEADER: 01432cam a2200337Ia 4500
001 7696212
005 20221201021120.0
008 040924s2003 paua b 000 0 eng d
020 $a0768010691
020 $a9780768010695
029 1 $aYDXCP$b2036254
029 1 $aAU@$b000043403617
035 $a(OCoLC)ocm56572267
035 $a(NNC)7696212
035 $a(OCoLC)56572267
035 $a7696212
040 $aOKU$cOKU$dOCLCQ$dBAKER$dYDXCP
050 4 $aTA407$b.R47 2003
245 00 $aResidual stress measurement by X-ray diffraction :$bSAE HS-784.
250 $a2003 ed.
260 $aWarrendale, Pa. :$bSAE International,$c2003.
300 $aix, 84 pages :$billustrations ;$c28 cm
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
500 $a"HS-784 2003 Edition was prepared by a team, led by Aquil Ahmad from Eaton Corporation, under the auspices of the SAE Fatigue Design and Evaluation Committee"--P. [v].
504 $aIncludes bibliographical references.
650 0 $aResidual stresses.$0http://id.loc.gov/authorities/subjects/sh85113138
650 0 $aX-rays$xIndustrial applications.$0http://id.loc.gov/authorities/subjects/sh85148752
700 1 $aAhmad, Aquil.$0http://id.loc.gov/authorities/names/no2018122215
710 2 $aSociety of Automotive Engineers.$bFatigue Design and Evaluation Committee.$0http://id.loc.gov/authorities/names/n77016507
852 00 $boff,eng$hTA407$i.R47 2003g