MARC Record from marc_columbia

LEADER: 02180cam a2200457Ia 4500
001 6985643
005 20221130200625.0
006 m d
007 cr mn|||||||||
008 060816t20022002nyua sb 001 0 eng d
020 $a1601190174 (Knovel ebook)
020 $a9781601190178 (Knovel ebook)
020 $a0306470403 (ebook)
020 $a9780306470400 (ebook)
020 $a0792379918 (alk. paper)
020 $a9780792379911 (alk. paper)
035 $a(OCoLC)ocm70916145
035 $a(OCoLC)70916145
035 $a(NNC)6985643
035 $a6985643
037 $bKnovel Corporation.$nhttp://www.knovel.com
040 $aWAU$cWAU$dWAU$dKNOVL$dTEF$dZCU
050 14 $aTK7874.75$b.B87 2002eb
082 04 $a621.39/5$222
100 1 $aBushnell, Michael L.$q(Michael Lee),$d1950-$0http://id.loc.gov/authorities/names/n88015041
245 10 $aEssentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /$cMichael L. Bushnell, Vishwani D. Agrawal.
260 $aNew York :$bKluwer Academic,$c[2002], ©2002.
300 $axviii, 690 pages :$bdigital, PDF file
336 $atext$btxt$2rdacontent
337 $acomputer$bc$2rdamedia
504 $aIncludes bibliographical references (p. [631]-670) and index.
533 $aElectronic reproduction.$b[Norwich, N.Y.] :$cKnovel,$d[2006].$nSystem requirements: Adobe Reader.$nMode of access: World Wide Web.$nContents and index pages have been reformatted by Knovel to provide easier navigation.$nAccess restricted to users at licensed institutions.$7s2006 nyun s
650 0 $aIntegrated circuits$xVery large scale integration$xTesting.$0http://id.loc.gov/authorities/subjects/sh2009127319
650 0 $aDigital integrated circuits$xTesting.
650 0 $aMixed signal circuits$xTesting.
650 0 $aSemiconductor storage devices$xTesting.
655 7 $aElectronic books.$2local
700 1 $aAgrawal, Vishwani D.,$d1943-$0http://id.loc.gov/authorities/names/n88254492
710 2 $aKnovel (Firm)$0http://id.loc.gov/authorities/names/nr2001027264
856 40 $uhttp://www.columbia.edu/cgi-bin/cul/resolve?clio6985643$zClick here for full text.
852 8 $blweb$hEBOOKS