MARC Record from marc_columbia

LEADER: 03130cam a22003734a 4500
001 6974411
005 20221130195907.0
008 080320t20092009fluaf bf 001 0 eng
010 $a 2008013026
019 $a150375703
020 $a9781420045543
020 $a1420045547
024 $a99932140383
035 $a(OCoLC)ocn213765926
035 $a(OCoLC)213765926$z(OCoLC)150375703
035 $a(NNC)6974411
035 $a6974411
040 $aDLC$cDLC$dBAKER$dBTCTA$dYDXCP$dOCLNG$dC#P$dOrLoB-B
050 00 $aQC372.2.D4$bH36 2009
082 00 $a681/.4$222
245 00 $aHandbook of charged particle optics /$cedited by Jon Orloff.
250 $a2nd ed.
260 $aBoca Raton :$bCRC Press,$c[2009], ©2009.
300 $axi, 665 pages, 7 unnumbered pages of plates :$billustrations (some color) ;$c27 cm
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
504 $aIncludes bibliographical references and index.
505 00 $g1.$tReview of ZrO/W Schottky Cathode /$rLyn W. Swanson and Gregory A. Schwind -- $g2.$tLiquid Metal Ion Sources /$rRichard G. Forbes and Graeme L. R. Mair -- $g3.$tGas Field Ionization Sources /$rRichard G. Forbes -- $g4.$tMagnetic Lenses for Electron Microscopy /$rKatsushige Tsuno -- $g5.$tElectrostatic Lenses /$rBohumila Lencova -- $g6.$tAberrations /$rPeter W. Hawkes -- $g7.$tSpace Charge and Statistical Coulomb Effects /$rPieter Kruit and Guus H. Jansen -- $g8.$tResolution /$rMitsugu Sato -- $g9.$tThe Scanning Electron Microscope /$rAndras E. Vladar and Michael T. Postek -- $g10.$tThe Scanning Transmission Electron Microscope /$rAlbert V. Crewe and Peter D. Nellist -- $g11.$tFocused Ion Beams /$rM. Utlaut -- $g12.$tAberration Correction in Electron Microscopy /$rOndrej L. Krivanek, Niklas Dellby and Matthew F. Murfitt -- $gApp.$tComputational Resources for Electron Microscopy /$rJ. Orloff.
520 1 $a"With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution-focused probe instruments." "The book's unique approach covers both the theoretical and practical knowledge of high-resolution probe-forming instruments. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field's cutting-edge technologies with added insight into how they work." "Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high-resolution probe instrumentation."--BOOK JACKET.
650 0 $aOptical instruments$xDesign and construction$vHandbooks, manuals, etc.
650 0 $aElectron optics$vHandbooks, manuals, etc.
700 1 $aOrloff, Jon.$0http://id.loc.gov/authorities/names/n96111868
856 42 $3Publisher description$uhttp://www.loc.gov/catdir/enhancements/fy0835/2008013026-d.html
852 00 $boff,sci$hQC372.2.D4$iH36 2009