| Record ID | marc_columbia/Columbia-extract-20221130-014.mrc:161898525:1348 |
| Source | marc_columbia |
| Download Link | /show-records/marc_columbia/Columbia-extract-20221130-014.mrc:161898525:1348?format=raw |
LEADER: 01348cam a2200325 a 4500
001 6972906
005 20221130195715.0
008 081121s2008 gw a b 101 0 eng d
020 $a3540894020 (pbk.)
020 $a9783540894025 (pbk.)
035 $a(OCoLC)276332274
035 $a(OCoLC)ocn276332274
035 $a(NNC)6972906
035 $a6972906
040 $aNNC$cNNC
050 4 $aQA76.76.S65$bI975 2008
111 2 $aIWSM-Mensura 2008$d(2008 :$cMunich, Germany)
245 10 $aSoftware process and product measurement :$binternational conferences, IWSM 2008, MetriKon 2008, and Mensura 2008, Munich, Germany, November 18-19, 2008 : proceedings /$cReiner R. Dumke [and others] (eds.).
260 $aBerlin ;$aNew York :$bSpringer,$c2008.
300 $axiii, 361 pages :$billustrations ;$c24 cm.
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
490 1 $aLecture notes in computer science,$x0302-9743 ;$v5338
504 $aIncludes bibliographical referencesand index
650 0 $aSoftware measurement$vCongresses.
700 1 $aDumke, Reiner.$0http://id.loc.gov/authorities/names/no00001333
700 1 $aBraungarten, René.
700 1 $aBüren, Günter.
830 0 $aLecture notes in computer science ;$v5338.$0http://id.loc.gov/authorities/names/n42015162
852 00 $boff,eng$hQA76.76.S65$iI975 2008g