| Record ID | marc_columbia/Columbia-extract-20221130-013.mrc:74886440:1855 |
| Source | marc_columbia |
| Download Link | /show-records/marc_columbia/Columbia-extract-20221130-013.mrc:74886440:1855?format=raw |
LEADER: 01855pam a22003494a 4500
001 6094435
005 20221121234139.0
008 070202t20072007njua b 001 0 eng
010 $a 2006019150
015 $aGBA694150$2bnb
016 7 $a013595874$2Uk
020 $a0471715298 (cloth)
020 $a9780471715290 (cloth)
035 $a(OCoLC)OCM70114535
035 $a(OCoLC)70114535
035 $a(NNC)6094435
035 $a6094435
040 $aDLC$cDLC$dBAKER$dUKM$dBTCTA$dC#P$dOrLoB-B
050 00 $aTS173$b.Y36 2007
082 00 $a620/.00452$222
100 1 $aYang, Guangbin,$d1964-$0http://id.loc.gov/authorities/names/n2006045746
245 10 $aLife cycle reliability engineering /$cGuangbin Yang.
260 $aHoboken, N.J. :$bWiley,$c[2007], ©2007.
300 $axiii, 517 pages :$billustrations ;$c25 cm
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
504 $aIncludes bibliographical references (p. 495-510) and index.
505 00 $g1.$tReliability engineering and product life cycle -- $g2.$tReliability definition, metrics, and product life distributions -- $g3.$tReliability planning and specification -- $g4.$tSystem reliability evaluation and allocation -- $g5.$tReliability improvement through robust design -- $g6.$tPotential failure mode avoidance -- $g7.$tAccelerated life tests -- $g8.$tDegradation testing and analysis -- $g9.$tReliability verification testing -- $g10.$tStress screening -- $g11.$tWarranty analysis -- $gApp.$tOrthogonal arrays, linear graphs, and interaction tables.
650 0 $aReliability (Engineering)$0http://id.loc.gov/authorities/subjects/sh85112511
650 0 $aProduct life cycle.$0http://id.loc.gov/authorities/subjects/sh85107202
856 41 $3Table of contents only$uhttp://www.loc.gov/catdir/toc/ecip0615/2006019150.html
852 00 $boff,eng$hTS173$i.Y36 2007