| Record ID | marc_columbia/Columbia-extract-20221130-009.mrc:246580455:2462 |
| Source | marc_columbia |
| Download Link | /show-records/marc_columbia/Columbia-extract-20221130-009.mrc:246580455:2462?format=raw |
LEADER: 02462cam a2200493Ma 4500
001 4239530
005 20221111172841.0
006 m o d
007 cr cn|||||||||
008 010405s2000 nyua ob 001 0 eng d
035 $a(OCoLC)ocm47008560
035 $a(NNC)4239530
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020 $a047143776X$q(electronic bk.)
020 $a9780471437765$q(electronic bk.)
020 $z0471348740$q(cloth ;$qalk. paper)
035 $a(OCoLC)47008560$z(OCoLC)533200985$z(OCoLC)961659389$z(OCoLC)962606687$z(OCoLC)970721850$z(OCoLC)984518173$z(OCoLC)1007399204$z(OCoLC)1053281901$z(OCoLC)1055834791$z(OCoLC)1087190427$z(OCoLC)1200054376
050 4 $aG70.212$b.L43 2000eb
072 7 $aTEC$x036000$2bisacsh
082 04 $a910/.285$221
049 $aZCUA
100 1 $aLee, Jay,$d1959-$eauthor.
245 10 $aGIS and statistical analysis with ArcView /$cJay Lee and David Wing-Shun Wong.
246 3 $aGeographic information systems and statistical analysis with ArcView
260 $aNew York :$bJohn Wiley,$c2000.
300 $a1 online resource (xi, 192 pages) :$billustrations
336 $atext$btxt$2rdacontent
337 $acomputer$bc$2rdamedia
338 $aonline resource$bcr$2rdacarrier
504 $aIncludes bibliographical references and index.
588 0 $aPrint version record.
630 00 $aArcView.
630 07 $aArcView.$2fast$0(OCoLC)fst01383490
650 0 $aGeographic information systems.
650 0 $aStatistics.
650 7 $aTECHNOLOGY & ENGINEERING$xRemote Sensing & Geographic Information Systems.$2bisacsh
650 7 $aGeographic information systems.$2fast$0(OCoLC)fst00940423
650 7 $aStatistics.$2fast$0(OCoLC)fst01132103
655 4 $aElectronic books.
700 1 $aWong, David W. S.,$eauthor.
776 08 $iPrint version:$aLee, Jay.$tGIS and statistical analysis with ArcView.$dNew York : John Wiley, 2000$z0471348740$w(DLC) 00032090$w(OCoLC)43913193
856 40 $uhttp://www.columbia.edu/cgi-bin/cul/resolve?clio4239530$zAll EBSCO eBooks
852 8 $blweb$hEBOOKS