| Record ID | marc_columbia/Columbia-extract-20221130-002.mrc:300927356:1406 |
| Source | marc_columbia |
| Download Link | /show-records/marc_columbia/Columbia-extract-20221130-002.mrc:300927356:1406?format=raw |
LEADER: 01406cam a2200373 a 4500
001 738084
005 20220525235831.0
008 890127m19889999ne a b 001 0 eng
010 $a 87024605
020 $a0444989390 (v. 1) :$c$175.00 (est.)
035 $a(OCoLC)16755087
035 $a(OCoLC)ocm16755087
035 $a(CStRLIN)NYCG89-B6304
035 $9ADF1179CU
035 $a(NNC)738084
035 $a738084
040 $dNNC
041 1 $aeng$hpol
050 00 $aQH207$b.P54 1988
082 0 $a502/.8/2$219
090 $aQH207$b.P54 1988
100 1 $aPluta, Maksymilian.$0http://id.loc.gov/authorities/names/n87855436
245 10 $aAdvanced light microscopy /$cMaksymilian Pluta.
260 $aAmsterdam ;$aNew York :$bElsevier ;$aWarszawa :$bPWN-Polish Scientific Publishers ;$aNew York, NY :$bDistribution for the USA and Canada, Elsevier Science Publishing Co.,$c1988-
300 $avolumes :$billustrations ;$c25 cm
336 $atext$2rdacontent
337 $aunmediated$2rdamedia
338 $avolume$2rdacarrier
500 $aTranslated from the Polish manuscript.
504 $aIncludes bibliographies and indexes.
505 0 $av. 1. Principles and basic properties -- v. 2. Specialized methods.-- v. 3. Measuring techniques
650 0 $aMicroscopy$xTechnique.$0http://id.loc.gov/authorities/subjects/sh85084912
852 01 $boff,sci$hQH207$i.P54 1988
866 41 $80$av.1-3