| Record ID | marc_columbia/Columbia-extract-20221130-001.mrc:309471648:1262 |
| Source | marc_columbia |
| Download Link | /show-records/marc_columbia/Columbia-extract-20221130-001.mrc:309471648:1262?format=raw |
LEADER: 01262cam a2200349 a 4500
001 245975
005 20220518223145.0
008 840814t19831983enka b 001 0 eng
010 $a 83006618
020 $a047126279X :$c$108.00
035 $a(OCoLC)9556397
035 $a(OCoLC)ocm09556397
035 $a(CStRLIN)NYCG84-B51525
035 $9ABB8937CU
035 $a(NNC)245975
035 $a245975
040 $dCStRLIN
050 00 $aTP156.S95$bP73 1983
082 0 $a620.1/1292$219
090 $aTP156.S95$bP73 1983
245 00 $aPractical surface analysis :$bby auger and x-ray photo-electron spectroscopy /$cedited by D. Briggs and M.P. Seah.
260 $aChichester ;$aNew York :$bWiley,$c[1983], ©1983.
300 $axiv, 533 pages :$billustrations ;$c24 cm
336 $atext$2rdacontent
337 $aunmediated$2rdamedia
338 $avolume$2rdacarrier
504 $aIncludes bibliographical references and index.
650 0 $aSurfaces (Technology)$xAnalysis.$0http://id.loc.gov/authorities/subjects/sh85130751
650 0 $aElectron spectroscopy.$0http://id.loc.gov/authorities/subjects/sh85042234
700 1 $aBriggs, D.
700 1 $aSeah, M. P.$0http://id.loc.gov/authorities/names/n83157504
852 00 $boff,eng$hTP156.S95$iP73 1983