| Record ID | marc_binghamton_univ/bgm_openlib_final_10-15.mrc:332184189:1549 |
| Source | Binghamton University |
| Download Link | /show-records/marc_binghamton_univ/bgm_openlib_final_10-15.mrc:332184189:1549?format=raw |
LEADER: 01549nam 2200385 a 4500
001 BIN01-001289476
005 20071118115643.0
007 he bmb024bbca
008 940131s1992 mdu bb f000 0 eng d
035 $a(OCoLC)ocm29708398
035 9 $aAFU0090$bSB
037 $a003-003-03169-1$bGPO$fpaper copy
040 $aGPO$cGPO$dWaOLN
049 $aBNGG
074 $a0247 (MF)
086 $aC 13.10:400-89
100 1 $aAlbers, John.
245 10 $aVersion 2.0 of the TXYZ thermal analysis program, TXYZ20$h[microform] /$cJohn Albers.
260 $aGaithersburg, MD :$bU.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology,$c1992.
300 $aiii, 29 p. ;$c28 cm.
490 1 $aSemiconductor measurement technology
490 1 $aNIST special publication ;$v400-89
500 $aDistributed to depository libraries in microfiche.
500 $aShipping list no.: 92-2593-M.
500 $aPaper version no longer for sale by the Supt. of Docs.
500 $a"June 1992."
504 $aIncludes bibliographical references (p. 18).
533 $aMicrofiche.$b[Washington, D.C.?] :$cSupt. of Docs., U.S. G.P.O.,$d[1992]$e1 microfiche : negative.
650 0 $aSemiconductors$xThermal properties.
650 0 $aThermal analysis$xComputer programs.
710 2 $aNational Institute of Standards and Technology (U.S.)
830 0 $aSemiconductor measurement technology
830 0 $aNIST special publication$v400-89.
852 30 $aBIN$bBINGO$cMMFRM$hC$i13.10:400-89$91
945 $d10/13/99$ntm