| Record ID | ia:xrayultraviolets3443unse |
| Source | Internet Archive |
| Download MARC XML | https://archive.org/download/xrayultraviolets3443unse/xrayultraviolets3443unse_marc.xml |
| Download MARC binary | https://www.archive.org/download/xrayultraviolets3443unse/xrayultraviolets3443unse_meta.mrc |
LEADER: 01288cam a2200289 a 4500
001 00500634
003 DLC
005 20000518104526.0
008 000304s1998 waua b 101 0 eng
010 $a 00500634
020 $a0819428981
040 $aDLC$cDLC$dDLC
050 00 $aQB468$b.X74 1998
082 00 $a522/.65$221
245 00 $aX-ray and ultraviolet spectroscopy and polarimetry II :$b23-24 July 1998, San Diego, California /$cSilvano Fineschi, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering.
246 3 $aX-ray and ultraviolet spectroscopy and polarimetry 2
246 3 $aX-ray and ultraviolet spectroscopy and polarimetry two
260 $aBellingham, Wash. :$bSPIE,$cc1998.
300 $av, 160 p. :$bill. ;$c28 cm.
490 1 $aProceedings / SPIE--the International Society for Optical Engineering ;$vv. 3443
504 $aIncludes bibliographical references and index.
650 0 $aPolarimetry$vCongresses.
650 0 $aX-ray astronomy$xInstruments$vCongresses.
650 0 $aUltraviolet astronomy$xInstruments$vCongresses.
700 1 $aFineschi, Silvano.
710 2 $aSociety of Photo-optical Instrumentation Engineers.
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 3443.