| Record ID | ia:trent_0116402118107 |
| Source | Internet Archive |
| Download MARC XML | https://archive.org/download/trent_0116402118107/trent_0116402118107_marc.xml |
| Download MARC binary | https://www.archive.org/download/trent_0116402118107/trent_0116402118107_meta.mrc |
LEADER: 01027cam 2200265Mi 4500
001 ocn869061300
003 OCoLC
005 20200121203504.0
008 840328s1983 ilua b 001 0 eng d
040 $aMUQ$bfre$cMUQ$dOCLCQ$dMUQ
035 $a(OCoLC)869061300
050 4 $aQH212.S3
245 00 $aScanning electron microscopy / 1983 :$ban international journal of scanning electron microscopy related techniques and applications /$cguest editors: Albrecht, R.M., Roomans, G.M.
260 $aChicago, Ill. :$bScanning Electron Microscopy,$c©1983.
300 $a4 v. (xl, 2045, xx p.) :$bill
336 $atexte$btxt$2rdacontent/fre
337 $asans médiation$bn$2rdamedia/fre
500 $aSur la couverture: SEM 1983.
650 0 $aScanning electron microscopes$aScanning electron microscopes.
650 6 $aMicroscopes électroniques à balayage.
700 1 $aAlbrecht, R. M.
700 1 $aRoomans, G. M.
710 2 $aScanning Electron Microscopy, Inc.
994 $aZ0$bP4A
948 $hNO HOLDINGS IN P4A - 1 OTHER HOLDINGS