| Record ID | ia:scanningelectron0000leer_g9k8 |
| Source | Internet Archive |
| Download MARC XML | https://archive.org/download/scanningelectron0000leer_g9k8/scanningelectron0000leer_g9k8_marc.xml |
| Download MARC binary | https://www.archive.org/download/scanningelectron0000leer_g9k8/scanningelectron0000leer_g9k8_meta.mrc |
LEADER: 00833pam a2200253 a 4500
001 91045512
003 DLC
005 19921214124525.5
008 911213s1993 njua b 001 0 eng c
010 $a 91045512
020 $a0138137595
040 $aDNLM/DLC$cDLC$dDLC
050 00 $aQH212.S3$bL44 1993
060 $aQH 212.S3 L479s
082 00 $a502/.8/25$220
100 1 $aLee, Robert Edward.
245 10 $aScanning electron microscopy and x-ray microanalysis /$cRobert Edward Lee.
260 $aEnglewood Cliffs, N.J. :$bPTR Prentice Hall,$cc1993.
300 $axiii, 458 p. :$bill. ;$c25 cm.
504 $aIncludes bibliographical references (p. 439-441) and index.
650 0 $aScanning electron microscopy.
650 0 $aX-ray microanalysis.
650 2 $aElectron Probe Microanalysis.
650 2 $aMicroscopy, Electron, Scanning.