| Record ID | ia:proceedingsieeew0000ieee |
| Source | Internet Archive |
| Download MARC XML | https://archive.org/download/proceedingsieeew0000ieee/proceedingsieeew0000ieee_marc.xml |
| Download MARC binary | https://www.archive.org/download/proceedingsieeew0000ieee/proceedingsieeew0000ieee_meta.mrc |
LEADER: 01456cam a22003134a 4500
001 99062868
003 DLC
005 20000524094523.0
008 990420s1999 caua b 101 0 eng
010 $a 99062868
020 $a0769501109
040 $aDLC$cDLC$dDLC
042 $apcc
050 00 $aTA1637$b.I3335 1999
082 00 $a621.36/7$221
111 2 $aIEEE Workshop on Multi-View Modeling & Analysis of Visual Scenes$d(1999 :$cFort Collins, Colo.)
245 10 $aProceedings, IEEE Workshop on Multi-View Modeling & Analysis of Visual Scenes (MVIEW'99) :$bJune 26, 1999 Fort Collins, Colorado /$csponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence.
246 30 $aIEEE Workshop on Multi-View Modeling & Analysis of Visual Scenes
246 30 $aMVIEW'99
246 14 $a1999 IEEE Workshop on Multi-View Modeling and Analysis of Visual Scenes
246 18 $a1999 IEEE Workshop on Multi-View Modeling and Analysis of Visual Scenes
260 $aLos Alamitos, Calif. :$bIEEE Computer Society,$cc1999.
300 $avii, 89 p. :$bill. ;$c28 cm.
504 $aIncludes bibliographical references and index.
650 0 $aImage processing$xDigital techniques$vCongresses.
650 0 $aImage analysis$vCongresses.
650 0 $aStereoscopic views$vCongresses.
650 0 $aImage reconstruction$vCongresses.
710 2 $aIEEE Computer Society.$bTechnical Committee on Pattern Analysis and Machine Intelligence.